International Journal of Testing: Themed Issue Call for Papers
The International Journal of Testing (IJT), the official peer-reviewed journal of the International Test Commission, is calling for submission of manuscripts for a themed issue on the Assessment of Linguistic Minorities.
Call for Papers
International Journal of Testing Themed Issue on the Assessment of Linguistic Minorities
Submission Deadline: August 31, 2013
The International Journal of Testing (IJT), the official peer-reviewed journal of the International Test Commission, is calling for submission of manuscripts for a themed issue on the Assessment of Linguistic Minorities. There are numerous problems associated with measuring the knowledge, skills, and abilities of linguistic minorities, as language can be a tremendous barrier to valid measurement whenever an examinee is not fully proficient in the language in which a test is administered. Test developers, test administrators, and those who interpret results from assessments need guidance as to best practices to ensure fair testing. Manuscripts submitted for the themed issue may illustrate work in this area from perspectives such as psychometrics, test validity, cross-cultural dimensions in assessments, quality control, and special features of psychological tests.
All submissions will undergo peer review by the Editors as well as reviewers with expertise in the topic.
Deadline for submission is August 31, 2013. Submissions for the themed issue must be submitted through IJT’s online submission system (http://mc.manuscriptcentral.com/hijt) with a note in the author cover letter expressing interest in being considered for publication as part of the themed issue. Recommended manuscript length is no more than 5,000 words not counting the abstract, tables, figure legends, and references, and the editors reserve the right to accept manuscripts of any length and/or limit manuscript length.
For full and specific instructions to authors, please visit our web link at:
Please contact Associate Editor April L. Zenisky (firstname.lastname@example.org) with additional questions about this themed issue.
April L. Zenisky, Ed.D.
Associate Editor, International Journal of Testing
University of Massachusetts Amherst, USA